Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns

MLA

Shawn P. Coleman, et al. “Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-Ray Diffraction Patterns.” ACS Combinatorial Science, vol. 19, Dec. 2016, pp. 25–36. EBSCOhost, https://doi.org/10.1021/acscombsci.6b00142.

APA

Shawn P. Coleman, Efraín Hernández-Rivera, & Mark A. Tschopp. (2016). Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns. ACS Combinatorial Science, 19, 25–36. https://doi.org/10.1021/acscombsci.6b00142

Chicago

Shawn P. Coleman, Efraín Hernández-Rivera, and Mark A. Tschopp. 2016. “Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-Ray Diffraction Patterns.” ACS Combinatorial Science 19 (December): 25–36. doi:10.1021/acscombsci.6b00142.