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Tuning SPT-3G transition-edge-sensor electrical properties with a four-ayer Ti–Au–Ti–Au thin-film stack

Authors :
T. de Haan
A. Cukierman
P. A. R. Ade
Daniel Michalik
W. B. Everett
Gensheng Wang
Trupti Khaire
C. L. Kuo
Joshua Montgomery
Andrew Nadolski
Zeeshan Ahmed
Amy N. Bender
V. Kutepova
C. S. Miller
Q. Y. Tang
K. T. Story
N. L. Harrington
Liliana Stan
D. Dutcher
A. J. Gilbert
Adam Anderson
John E. Pearson
Jessica Avva
Carole Tucker
Bradford Benson
Erik Shirokoff
Stephen Padin
N. W. Halverson
Nathan Whitehorn
Kent D. Irwin
C. M. Posada
W. L. Holzapfel
J. F. Cliche
Aaron Lee
Joaquin Vieira
J. A. Sobrin
Donna Kubik
H. Nguyen
Jason E. Austermann
S. S. Meyer
A. H. Harke-Hosemann
A. E. Lowitz
I. Shirley
J. T. Sayre
L. J. Saunders
K. W. Yoon
A. M. Kofman
Graeme Smecher
N. Huang
G. I. Noble
M. Jonas
Aritoki Suzuki
M. Korman
Alexandra S. Rahlin
R. Basu Thakur
Chihway Chang
K. Vanderlinde
Jason W. Henning
R. N. Gannon
M. R. Young
John E. Carlstrom
Oliver Jeong
A. A. Stark
Thomas Cecil
T. Natoli
A. Foster
V. Novosad
John Groh
J. E. Ruhl
Leila R. Vale
M. A. Dobbs
K. L. Thompson
Z. Pan
Faustin Carter
S. E. Kuhlmann
Junjia Ding
Gene C. Hilton
E. V. Denison
V. G. Yefremenko
Ralu Divan
Publication Year :
2018
Publisher :
Springer Verlag (Germany), 2018.

Abstract

We have developed superconducting Ti transition-edge sensors with Au protection layers on the top and bottom for the South Pole Telescope’s third-generation receiver (a cosmic microwave background polarimeter, due to be upgraded this austral summer of 2017/2018). The base Au layer (deposited on a thin Ti glue layer) isolates the Ti from any substrate effects; the top Au layer protects the Ti from oxidation during processing and subsequent use of the sensors. We control the transition temperature and normal resistance of the sensors by varying the sensor width and the relative thicknesses of the Ti and Au layers. The transition temperature is roughly six times more sensitive to the thickness of the base Au layer than to that of the top Au layer. The normal resistance is inversely proportional to sensor width for any given film configuration. For widths greater than five micrometers, the critical temperature is independent of width.

Details

Language :
English
ISSN :
00222291
Database :
OpenAIRE
Accession number :
edsair.doi.dedup.....0b9228c9627547e28f9d6481c0f786b2