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Mimicking an Atomically Thin 'Vacuum Spacer' to Measure the Hamaker Constant between Graphene Oxide and Silica
- Source :
- Advanced Materials Interfaces, 4(5)
- Publication Year :
- 2017
-
Abstract
- The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce study. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar direction compared with other dimensional spacers.
- Subjects :
- Materials science
Yield (engineering)
Physics::Instrumentation and Detectors
Hamaker constant
Oxide
Physics::Optics
Nanotechnology
02 engineering and technology
010402 general chemistry
01 natural sciences
law.invention
Condensed Matter::Materials Science
symbols.namesake
chemistry.chemical_compound
Atomic force microscopy
Planar
law
Atom
Physics::Atomic and Molecular Clusters
Vacuum spacers
Physics::Atomic Physics
Graphene oxide paper
Graphene oxide
Graphene
Mechanical Engineering
021001 nanoscience & nanotechnology
2D materials
0104 chemical sciences
chemistry
Mechanics of Materials
Chemical physics
symbols
van der Waals force
0210 nano-technology
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Advanced Materials Interfaces, 4(5)
- Accession number :
- edsair.doi.dedup.....0b05281ff8ffa1348344886a6e1c85ac