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Mimicking an Atomically Thin 'Vacuum Spacer' to Measure the Hamaker Constant between Graphene Oxide and Silica

Authors :
Anping Cao
Sumit Sachdeva
Z. Liu
Ernst J. R. Sudhölter
Louis C. P. M. de Smet
Stephen J. Picken
Alexander V. Korobko
Liangyong Chu
Nicolaas A. M. Besseling
Source :
Advanced Materials Interfaces, 4(5)
Publication Year :
2017

Abstract

The Hamaker constant between graphene oxide and silica, which quantifies the strength of van der Waals forces is determined, by mimicking a “vacuum spacer” in an atomic force microscopyforce study. It is demonstrated that, a 2D spacer is expected to yield an accurately defined separation, owing to the high atom density and strength in planar direction compared with other dimensional spacers.

Details

Language :
English
Database :
OpenAIRE
Journal :
Advanced Materials Interfaces, 4(5)
Accession number :
edsair.doi.dedup.....0b05281ff8ffa1348344886a6e1c85ac