Aperiodic nanometer multilayer systems as optical key components for attosecond electron spectroscopy

Authors :: Ulrich Heinzmann
Ulf Kleineberg
Nikolay M. Kabachnik
Wiebke Hachmann
T. Westerwalbesloh
Andreas Wonisch
Source :: Thin Solid Films. :473-477
Publication Year :: 2004
Publisher :: Elsevier BV, 2004.
Abstract: Tailored extreme ultraviolet (EUV) multilayer systems have been designed, fabricated and characterized for applications as optical key components for guiding or monochromatizing ultrashort sub-femtosecond EUV pulses emitted from Ti:Sa laser-driven high harmonic sources. While spectral filtering of individual harmonic requires a periodic multilayer mirror exhibiting a small reflection bandwidth

Subjects :: Fabrication
business.industry
Chemistry
Attosecond
Extreme ultraviolet lithography
Bandwidth (signal processing)
Metals and Alloys
Physics::Optics
Surfaces and Interfaces
Electromagnetic radiation
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Optics
Aperiodic graph
Harmonics
Extreme ultraviolet
Materials Chemistry
Astrophysics::Solar and Stellar Astrophysics
business

Tools