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Review of Si-Based GeSn CVD Growth and Optoelectronic Applications

Authors :
Luo Xue
Bin Lu
Henry H. Radamson
Yan Dong
Zhenzhen Kong
Hongxiao Lin
Xuewei Zhao
Yuanhao Miao
Linpeng Dong
Buqing Xu
Guilei Wang
Jinbiao Liu
Jiuren Zhou
Source :
Nanomaterials, Vol 11, Iss 2556, p 2556 (2021), Nanomaterials
Publication Year :
2021
Publisher :
MDPI AG, 2021.

Abstract

GeSn alloys have already attracted extensive attention due to their excellent properties and wide-ranging electronic and optoelectronic applications. Both theoretical and experimental results have shown that direct bandgap GeSn alloys are preferable for Si-based, high-efficiency light source applications. For the abovementioned purposes, molecular beam epitaxy (MBE), physical vapour deposition (PVD), and chemical vapor deposition (CVD) technologies have been extensively explored to grow high-quality GeSn alloys. However, CVD is the dominant growth method in the industry, and it is therefore more easily transferred. This review is focused on the recent progress in GeSn CVD growth (including ion implantation, in situ doping technology, and ohmic contacts), GeSn detectors, GeSn lasers, and GeSn transistors. These review results will provide huge advancements for the research and development of high-performance electronic and optoelectronic devices.

Details

Language :
English
ISSN :
20794991
Volume :
11
Issue :
2556
Database :
OpenAIRE
Journal :
Nanomaterials
Accession number :
edsair.doi.dedup.....06291d43ac28e65a15aae6d242aadbb8