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Analytical Study of the Impacts of Stochastic Load Fluctuation on the Dynamic Voltage Stability Margin Using Bifurcation Theory
- Publication Year :
- 2019
- Publisher :
- arXiv, 2019.
-
Abstract
- This paper studies the impacts of stochastic load fluctuations, namely the fluctuation intensity and the load power variation speed, on power system dynamic voltage stability. Additionally, the trade-off relationship between the two parameters is revealed, which provides important insights regarding the potential of using energy storage to maintain voltage stability under high uncertainty. To this end, Stochastic Differential-Algebraic Equations (SDAEs) are used to model the stochastic load variation; bifurcation analysis is carried out to explain the influence of stochasticity. Numerical study and Monte Carlo simulations on the IEEE 14-bus system demonstrate that a larger fluctuation intensity or a slower load power variation speed may lead to a smaller voltage stability margin. To the best of authors' knowledge, this work uncovers the impacts of the time evolution property of the driving parameters, i.e., the load power variation speed and its trade off effect with the fluctuation intensity on the size of the dynamic voltage stability margin.<br />Comment: 10 pages, Accept by IEEE Transactions on Circuits and Systems-I: Regular Papers on September 17, 2019
- Subjects :
- Stochastic process
020209 energy
020208 electrical & electronic engineering
Monte Carlo method
02 engineering and technology
Systems and Control (eess.SY)
Electrical Engineering and Systems Science - Systems and Control
Power (physics)
Electric power system
Bifurcation theory
13. Climate action
Margin (machine learning)
Control theory
0202 electrical engineering, electronic engineering, information engineering
FOS: Electrical engineering, electronic engineering, information engineering
Electrical and Electronic Engineering
Intensity (heat transfer)
Mathematics
Numerical stability
Subjects
Details
- Database :
- OpenAIRE
- Accession number :
- edsair.doi.dedup.....05ee27f050df0e75d014b82ff7c17e6e
- Full Text :
- https://doi.org/10.48550/arxiv.1910.10205