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Registration accuracy and quality of real-life images

Authors :
Wei-Yen Hsu
Source :
PLoS ONE, Vol 7, Iss 7, p e40558 (2012), PLoS ONE
Publication Year :
2012
Publisher :
Public Library of Science (PLoS), 2012.

Abstract

Background A common registration problem for the application of consumer device is to align all the acquired image sequences into a complete scene. Image alignment requires a registration algorithm that will compensate as much as possible for geometric variability among images. However, images captured views from a real scene usually produce different distortions. Some are derived from the optic characteristics of image sensors, and others are caused by the specific scenes and objects. Methodology/Principal Findings An image registration algorithm considering the perspective projection is proposed for the application of consumer devices in this study. It exploits a multiresolution wavelet-based method to extract significant features. An analytic differential approach is then proposed to achieve fast convergence of point matching. Finally, the registration accuracy is further refined to obtain subpixel precision by a feature-based modified Levenberg-Marquardt method. Due to its feature-based and nonlinear characteristic, it converges considerably faster than most other methods. In addition, vignette compensation and color difference adjustment are also performed to further improve the quality of registration results. Conclusions/Significance The performance of the proposed method is evaluated by testing the synthetic and real images acquired by a hand-held digital still camera and in comparison with two registration techniques in terms of the squared sum of intensity differences (SSD) and correlation coefficient (CC). The results indicate that the proposed method is promising in registration accuracy and quality, which are statistically significantly better than other two approaches.

Details

Language :
English
ISSN :
19326203
Volume :
7
Issue :
7
Database :
OpenAIRE
Journal :
PLoS ONE
Accession number :
edsair.doi.dedup.....047adbc0ac24e6e70f5833f6885116ce