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Impact of implicit effects on uncertainties and sensitivities of the Doppler coefficient of a LWR pin cell
- Source :
- EPJ Web of Conferences, Vol 146, p 09034 (2017)
- Publication Year :
- 2017
- Publisher :
- EDP Sciences, 2017.
-
Abstract
- In the present work, PSI and GRS sensitivity analysis (SA) and uncertainty quantification (UQ) methods, SHARK-X and XSUSA respectively, are compared for reactivity coefficient calculation; for reference the results of the TSUNAMI and SAMPLER modules of the SCALE code package are also provided. The main objective of paper is to assess the impact of the implicit effect, e.g., considering the effect of cross section perturbation on the self-shielding calculation, on the Doppler coefficient SA and UQ. Analyses are done for a Light Water Reactor (LWR) pin cell based on Phase I of the UAM LWR benchmark. The negligence of implicit effects in XSUSA and TSUNAMI leads to deviations of a few percent between the sensitivity profiles compared to SAMPLER and TSUNAMI (incl. implicit effects) except for 238 U elastic scattering. The implicit effect is much larger for the SHARK-X calculations because of its coarser energy group structure between 10 eV and 10 keV compared to the applied SCALE libraries. It is concluded that the influence of the implicit effect strongly depends on the energy mesh of the nuclear data library of the neutron transport solver involved in the UQ calculations and may be magnified by the response considered.
- Subjects :
- Elastic scattering
Neutron transport
Engineering
business.industry
Physics
QC1-999
020209 energy
Perturbation (astronomy)
Nuclear data
02 engineering and technology
Mechanics
Solver
symbols.namesake
0202 electrical engineering, electronic engineering, information engineering
symbols
Light-water reactor
Uncertainty quantification
business
Doppler effect
Simulation
Subjects
Details
- ISSN :
- 2100014X
- Volume :
- 146
- Database :
- OpenAIRE
- Journal :
- EPJ Web of Conferences
- Accession number :
- edsair.doi.dedup.....03a667532e866d5e8d1c61f9e4cdd855
- Full Text :
- https://doi.org/10.1051/epjconf/201714609034