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Large Area Nanoparticle Alignment by Chemical Lift-Off Lithography

Authors :
Hsiao-Yuan Chu
Hong-Hseng Chan
Yu-Wei Huang
Wei-Ssu Liao
Chia-Hsuan Chang
Yi-Jing Li
Chang-Ming Wang
Chong-You Chen
Source :
Nanomaterials
Publication Year :
2018
Publisher :
MDPI, 2018.

Abstract

Nanoparticle alignment on the substrate attracts considerable attention due to its wide application in different fields, such as mechanical control, small size electronics, bio/chemical sensing, molecular manipulation, and energy harvesting. However, precise nanoparticle positioning and deposition control with high fidelity are still challenging. Herein, a straightforward strategy for high quality nanoparticle-alignment by chemical lift-off lithography (CLL) is demonstrated. This technique creates high resolution self-assembled monolayer (SAM) chemical patterns on gold substrates, enabling nanoparticle-selective deposition and precise alignment. The fabricated nanoparticle arrangement geometries and dimensions are well-controllable in a large area. With proper nanoparticle surface functionality control and adequate substrate molecular manipulation, well-defined nanoparticle arrays with single-particle-wide alignment resolution are achieved.

Details

Language :
English
ISSN :
20794991
Volume :
8
Issue :
2
Database :
OpenAIRE
Journal :
Nanomaterials
Accession number :
edsair.doi.dedup.....03377a501666c173da727e67acee858a