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Electrical transport properties of half-heusler ScPdBi single crystals under extreme conditions

Authors :
S.D. Ramarao
Sebastian C. Peter
Manuel Núñez-Regueiro
Marie-Aude Méasson
Ashutosh Kumar Singh
Amit Pawbake
Jawaharlal Nehru Centre for Advanced Scientific Research (JNCASR)
Magnétisme et Supraconductivité (MagSup)
Institut Néel (NEEL)
Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )
Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )
Université Grenoble Alpes (UGA)
Source :
Journal of Alloys and Compounds, Journal of Alloys and Compounds, Elsevier, 2020, 848, pp.156632. ⟨10.1016/j.jallcom.2020.156632⟩
Publication Year :
2020
Publisher :
Elsevier BV, 2020.

Abstract

We synthesize single-crystals of ScPdBi, a Half-Heusler compound by self-flux growth technique and report its physical properties such as magneto-transport and specific heat down to 2 K. Resistivity measurements were performed on these single-crystals at ambient and high-pressure conditions. Temperature-dependent resistivity measurements reveal that ScPdBi shows the metallic character at ambient pressure and without applied magnetic field. The metallic character of ScPdBi was un-altered even in extreme conditions such as high pressure (up to 19 GPa) and magnetic field (up to 9 T). We observe an upturn in the resistivity which persists even at high pressure. We rule-out the presence of the Kondo effect by performing the specific heat measurements down to 2 K which resulted in a low Sommerfeld coefficient (γ ≈ 2.6 ± 0.9 mJ mol−1 K−2). This anomaly in resistivity below 30 K could be attributed to an electron-hole scattering process or a carrier imbalance effect.

Details

ISSN :
09258388
Volume :
848
Database :
OpenAIRE
Journal :
Journal of Alloys and Compounds
Accession number :
edsair.doi.dedup.....014624d292ca25a990aa52ace95af236
Full Text :
https://doi.org/10.1016/j.jallcom.2020.156632