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Ultrafast X-Ray Scattering of Xenon Nanoparticles: Imaging Transient States of Matter

Authors :
H. Thomas
A. R. B. de Castro
Karl-Heinz Meiwes-Broer
H. Wabnitz
Matthias Hoener
J. Tiggesbäumker
Tim Laarmann
J. Schneider
E. Eremina
Rolf Treusch
Elke Plönjes
M. Adolph
Christoph Bostedt
Thomas Möller
Daniela Rupp
Source :
Physical review letters 108, 093401 (2012). doi:10.1103/PhysRevLett.108.093401
Publication Year :
2012
Publisher :
American Physical Society (APS), 2012.

Abstract

Femtosecond x-ray laser flashes with power densities of up to ${10}^{14}\text{ }\text{ }\mathrm{W}/{\mathrm{cm}}^{2}$ at 13.7 nm wavelength were scattered by single xenon clusters in the gas phase. Similar to light scattering from atmospheric microparticles, the x-ray diffraction patterns carry information about the optical constants of the objects. However, the high flux of the x-ray laser induces severe transient changes of the electronic configuration, resulting in a tenfold increase of absorption in the developing nanoplasma. The modification in opaqueness can be correlated to strong atomic charging of the particle leading to excitation of ${\mathrm{Xe}}^{4+}$. It is shown that single-shot single-particle scattering on femtosecond time scales yields insight into ultrafast processes in highly excited systems where conventional spectroscopy techniques are inherently blind.

Details

ISSN :
10797114 and 00319007
Volume :
108
Database :
OpenAIRE
Journal :
Physical Review Letters
Accession number :
edsair.doi.dedup.....00a37cee894b2850988797b2e4766059
Full Text :
https://doi.org/10.1103/physrevlett.108.093401