Image observation of diffraction spots using FZP and coherent X-ray beam

New small angle X‐ray dispersion speckle method by the condensing optical system using FZP (Fresnel zone plate) was performed. And single crystal diffraction spot image was observed using this optical system. High photon flux with the FZP of 100‐micron‐diameter is obtained than that with a 5‐micron‐diameter pinhole. S/N ratio of data improved and measurement time also became short. The minimum beam size focused with the FZP was 0.25 μm. The speckle image resulting from the non‐ordering structure and periodic structure of 10nm order is successfully observed. This optical system was applicable also to diffraction spot image observation. We show a possibility that the information of the periodic and/or random structural analysis with sub‐μm order which were unsuitable with the conventional single crystal x‐ray diffraction analysis.