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Stability of Mo/Si Multilayer Structure Used in Bragg-Fresnel Optics

Authors :
Zi-chun Le
Cheng-jia Cui
Jingqiu Liang
Xing-lin Li
Shu Pei
Jian-lin Cao
Jinsong Yao
Source :
Chinese Physics Letters. 15:522-524
Publication Year :
1998
Publisher :
IOP Publishing, 1998.

Abstract

The thermal and chemical stabilities of Mo/Si multilayer structure used in Bragg-Fresnel optics were studied to get optimal technological parameters of pattern generation. Mo/Si multilayers were annealed at temperature ranging from 360 to 770 K, treated with acetone and 5 parts per thousand NaOH solution, and characterized by small-angle x-ray diffraction technique as well as x-ray photoelectron spectroscopy, and Olympus microscopy.

Details

ISSN :
17413540 and 0256307X
Volume :
15
Database :
OpenAIRE
Journal :
Chinese Physics Letters
Accession number :
edsair.doi...........ff9502a1456b016b813651e6de867761