Back to Search
Start Over
Optical nanoscopy characterization of nanofilms
- Source :
- Journal of Physics: Conference Series. 780:012003
- Publication Year :
- 2017
- Publisher :
- IOP Publishing, 2017.
-
Abstract
- Glass formation and glassy behavior remains an important field of study in condensed matter physics, with many aspects still little understood. The approach used in this work is to observe the changes in behavior of glass-forming materials at the nanometer scale by exploring the viscoelastic properties of ultrathin free-standing glassy polymer films. An experimental measurement cell based on the nanobubble inflation method is used, consisting of inflating a polymer film suspended over an array of 5 µm diameter holes in a Si wafer. Measuring the deformation as a function of time as the material relaxes is used to determine the creep compliance. Both polystyrene (PS) and poly(vinyl acetate) (PVAc) films of a few tens of nm thickness prepared by spin-coating from solution have been studied. Interference microscopy is used to measure the deformation over several hours, which is challenging at the nanoscale due to mechanical deformations and drift. In this paper we present some of the first solutions developed to allow consistent measurements of film deformation using this novel interference nanoscopy technique. Future work will involve the measurements of creep compliance as a function of different film properties so as to be able to compare the results with theoretical predictions.
- Subjects :
- chemistry.chemical_classification
History
Materials science
Nanotechnology
Polymer
Deformation (meteorology)
01 natural sciences
Interference microscopy
Viscoelasticity
Computer Science Applications
Education
Characterization (materials science)
010309 optics
Creep
chemistry
0103 physical sciences
Wafer
Composite material
010306 general physics
Nanoscopic scale
Subjects
Details
- ISSN :
- 17426596 and 17426588
- Volume :
- 780
- Database :
- OpenAIRE
- Journal :
- Journal of Physics: Conference Series
- Accession number :
- edsair.doi...........fdb06bed80b956a77631449eda479a87