29.1: Invited Paper: Degradation Mechanism of High Mobility Oxide Thin Film Transistors for Next Generation Display

Authors :: Yukiharu Uraoka
Mami N. Fujii
Juan Paolo Bermundo
Ryoko Miyanaga
Takanori Takahashi
Mutsunori Uenuma
Source :: SID Symposium Digest of Technical Papers. 52:395-398
Publication Year :: 2021
Publisher :: Wiley, 2021.

Subjects :: chemistry.chemical_compound
Reliability (semiconductor)
Materials science
chemistry
business.industry
Thin-film transistor
Oxide
Optoelectronics
Degradation (geology)
business
Mechanism (sociology)

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