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Bias Temperature Instability in Tunnel FETs
- Source :
- Extended Abstracts of the 2016 International Conference on Solid State Devices and Materials.
- Publication Year :
- 2016
- Publisher :
- The Japan Society of Applied Physics, 2016.
- Subjects :
- Materials science
Temperature instability
Nanotechnology
Engineering physics
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- Extended Abstracts of the 2016 International Conference on Solid State Devices and Materials
- Accession number :
- edsair.doi...........fc95f29a403e415d00506f39969730a7
- Full Text :
- https://doi.org/10.7567/ssdm.2016.a-6-01