Back to Search Start Over

Characteristics of microwave planar transmission lines using superconducting oxide films

Authors :
Shugo Kubo
Yasuhiro Nagai
Makoto Sato
Tsuneo Konaka
Hidefumi Asano
Source :
Electronics and Communications in Japan (Part II: Electronics). 75:83-94
Publication Year :
1992
Publisher :
Wiley, 1992.

Abstract

It is expected that the superior high-frequency characteristics, such as low loss and low dispersion, of superconducting oxides are applied to microwave circuits. However, low-loss superconducting oxide films can only be fabricated on limited types of substrate materials using present technologies. Therefore, the dielectric constant, dielectric loss, and thickness of substrate materials place severe limitations on the circuit design and the propagation characteristics. This paper discusses the attenuation constants, characteristic impedances, and wiring density of three fundamental planar transmission lines, namely, stripline, microstrip line, and coplanar waveguide fabricated on substrate materials MgO and LaAlO3. This discussion is based on the TEM and quasi-TEM analysis procedures. The thin films with low surface resistances have been fabricated on MgO and LaAlO3. It is concluded that the microstrip line is suitable for fabricating a low-loss transmission line and the coplanar waveguide on a low dielectric constant substrate is suitable for high-density wirings. Also measured were the characteristics of the half-wave transmission line resonators of these three transmission line configurations, which are made of EuBa2Cu3Ox thin films on an MgO substrate. The attenuation constant of 50 Ω, 50-μm wide coplanar waveguide is 9.7 × 10−3 Np/m (8.4 × 10−2 dB/m) at 3.9 GHz and 28 K. This value is two orders of magnitude lower than that of the copper transmission line.

Details

ISSN :
15206432 and 8756663X
Volume :
75
Database :
OpenAIRE
Journal :
Electronics and Communications in Japan (Part II: Electronics)
Accession number :
edsair.doi...........fc006e6248ce51d3517b59a8b38f4c73
Full Text :
https://doi.org/10.1002/ecjb.4420750809