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Tip preparation for usage in an ultra-low temperature UHV scanning tunneling microscope
- Source :
- Science and Technology of Advanced Materials. 8:347-351
- Publication Year :
- 2007
- Publisher :
- Informa UK Limited, 2007.
-
Abstract
- This work deals with the preparation and characterization of tungsten tips for the use in UHV low-temperature scanning tunneling microscopy and spectroscopy (STM and STS, respectively). These specific environments require in situ facilities for tip conditioning, for further sharpening of the tips, as well as for reliable tip characterization. The implemented conditioning methods include direct resistive annealing, annealing by electron bombardment, and self-sputtering with noble gas ions. Moreover, results from in situ tip characterization by field emission and STM experiments were compared to ex situ scanning electron microscopy. Using the so-prepared tips, high resolution STM images and tunneling spectra were obtained in a temperature range from ambient down to 350 mK, partially with applied magnetic field, on a variety of materials.
- Subjects :
- Scanning probe microscopy
Materials science
law
Scanning tunneling spectroscopy
Scanning confocal electron microscopy
Analytical chemistry
Scanning ion-conductance microscopy
General Materials Science
Spin polarized scanning tunneling microscopy
Conductive atomic force microscopy
Scanning tunneling microscope
Electrochemical scanning tunneling microscope
law.invention
Subjects
Details
- ISSN :
- 18785514 and 14686996
- Volume :
- 8
- Database :
- OpenAIRE
- Journal :
- Science and Technology of Advanced Materials
- Accession number :
- edsair.doi...........fb860812e3a588be27c541e323a084d1