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Metal-assisted chemical vertical etching of Si: Effect of catalyst morphology and oxidant concentration

Authors :
A Suresh
B R Deepu
Sangeeth Kallat
P. Savitha
Source :
2014 IEEE 2nd International Conference on Emerging Electronics (ICEE).
Publication Year :
2014
Publisher :
IEEE, 2014.

Abstract

Deep vertical etching of Si using hydrogen peroxide as oxidant and Au as catalyst has been studied in terms of relative reactant concentrations and catalyst morphology. The concentrations of hydrogen peroxide and hydrofluoric acid are highly important and the ratio of the same can be varied to achieve isotropic to highly anisotropic vertical etching. Catalyst morphology and positioning of the substrate was also seen to affect vertical etch profiles, with high catalyst deposition rates and horizontal placement of the sample giving deep etching without defects.

Details

Database :
OpenAIRE
Journal :
2014 IEEE 2nd International Conference on Emerging Electronics (ICEE)
Accession number :
edsair.doi...........fb764d969ea9dfa62f6817222fae1fd8