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Single-ZnO-Nanowire Memory

Authors :
Yen-De Chiang
Jr-Hau He
Cheng-Ying Chen
Tai-Bor Wu
Su-Jien Lin
Ching-Yuan Ho
Wen-Yuan Chang
Chih-Hsiang Ho
Source :
IEEE Transactions on Electron Devices. 58:1735-1740
Publication Year :
2011
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2011.

Abstract

Single-ZnO-nanowire (NW) memory based on resistive switching is demonstrated for the first time. The NW memory is stable, rewritable, and nonvolatile with on/off ratio up to 7.7 × 105. The O vacancies at the surfaces of ZnO NWs and around the interface of Ti/ZnO NWs observed using X-ray phototelectron spectroscopy, transmission electron microscopy (TEM), selected-area electron diffraction, and high-resolution TEM might play a role in the resistive switching behavior. The endurance of resistive switching can be enhanced by further increasing the sweeping voltage. This paper brings an exciting possibility of building next-generation memory devices based on NWs.

Details

ISSN :
15579646 and 00189383
Volume :
58
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices
Accession number :
edsair.doi...........fb6293775f282ca01b34779931eaa65d