Effect of long-term stability of the aluminium nitride - silicon interface for microwave-frequency electronic devices

MLA

Holger Fiedler, et al. “Effect of Long-Term Stability of the Aluminium Nitride - Silicon Interface for Microwave-Frequency Electronic Devices.” Applied Surface Science, vol. 551, June 2021, p. 149461. EBSCOhost, https://doi.org/10.1016/j.apsusc.2021.149461.

APA

Holger Fiedler, Mitchell Nancarrow, Jérôme Leveneur, John Kennedy, & David R. G. Mitchell. (2021). Effect of long-term stability of the aluminium nitride - silicon interface for microwave-frequency electronic devices. Applied Surface Science, 551, 149461. https://doi.org/10.1016/j.apsusc.2021.149461

Chicago

Holger Fiedler, Mitchell Nancarrow, Jérôme Leveneur, John Kennedy, and David R. G. Mitchell. 2021. “Effect of Long-Term Stability of the Aluminium Nitride - Silicon Interface for Microwave-Frequency Electronic Devices.” Applied Surface Science 551 (June): 149461. doi:10.1016/j.apsusc.2021.149461.