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Thermal transport in a semiconductor heterostructure measured by time-resolved x-ray diffraction
- Source :
- Physical Review B. 78
- Publication Year :
- 2008
- Publisher :
- American Physical Society (APS), 2008.
Details
- ISSN :
- 1550235X and 10980121
- Volume :
- 78
- Database :
- OpenAIRE
- Journal :
- Physical Review B
- Accession number :
- edsair.doi...........fb1171bec6fce692032489b4ea0eec24
- Full Text :
- https://doi.org/10.1103/physrevb.78.045317