Local structural analysis of In-doped Bi2 Se3 topological insulator using X-ray fluorescence holography

Authors :: Koji Kimura
Shinya Hosokawa
Yoshihiro Ebisu
Naohisa Happo
Hiroo Tajiri
Tomohiro Matsushita
Takumi Nishioka
Lada V. Yashina
Toru Ozaki
Yuta Yamamoto
Koichi Hayashi
Source :: Surface and Interface Analysis. 51:51-55
Publication Year :: 2018
Publisher :: Wiley, 2018.

Subjects :: Materials science
business.industry
Doping
Synchrotron radiation
02 engineering and technology
Surfaces and Interfaces
General Chemistry
021001 nanoscience & nanotechnology
Condensed Matter Physics
01 natural sciences
Surfaces, Coatings and Films
Topological insulator
0103 physical sciences
Materials Chemistry
Optoelectronics
010306 general physics
0210 nano-technology
business
X-ray fluorescence holography

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