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Just-Enough Stress Test for Infant-Mortality Screening Using Speed Binning

Authors :
Chen-Lin Tsai
Shi-Yu Huang
Source :
2022 IEEE International Test Conference (ITC).
Publication Year :
2022
Publisher :
IEEE, 2022.

Details

Database :
OpenAIRE
Journal :
2022 IEEE International Test Conference (ITC)
Accession number :
edsair.doi...........fa33b730a4dba4ba38c40aa2271854c2
Full Text :
https://doi.org/10.1109/itc50671.2022.00021