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Analyzer-based phase contrast imaging and phase retrieval using a rotating anode x-ray source

Authors :
Eckhart Förster
David Vine
Ingo Uschmann
O. Wehrhan
David M. Paganin
J. Kräußlich
Konstantin Mikhailovitch Pavlov
Source :
Applied Physics Letters. 91:254110
Publication Year :
2007
Publisher :
AIP Publishing, 2007.

Abstract

We have performed an analyzer crystal based phase contrast imaging (ABI) experiment using a rotating anode x-ray source. The use of such an incoherent source demonstrates the potential of ABI as a quantitative characterization tool for the laboratory environment. A phase contrast image of a plastic phantom was recorded on high resolution x-ray film and the projected thickness was retrieved from a single image. The projected thickness recovered from the phase contrast image was shown to quantitatively agree with a reference optical microscope measurement.

Details

ISSN :
10773118 and 00036951
Volume :
91
Database :
OpenAIRE
Journal :
Applied Physics Letters
Accession number :
edsair.doi...........f90174a75802e96a960990888f969c8e