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Memory Access Time and Input Size Effects on Parallel Processors Reliability

Authors :
Daniel Oliveira
Paolo Rech
Luigi Carro
Philippe O. A. Navaux
Laércio Lima Pilla
Caio Lunardi
Source :
IEEE Transactions on Nuclear Science. 62:2627-2634
Publication Year :
2015
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2015.

Subjects

Subjects :
Nuclear and High Energy Physics
Nuclear Energy and Engineering
Computer science
Electrical and Electronic Engineering
Reliability (statistics)
Access time
Reliability engineering

Details

ISSN :
15581578 and 00189499
Volume :
62
Database :
OpenAIRE
Journal :
IEEE Transactions on Nuclear Science
Accession number :
edsair.doi...........f8a1df52109775155ab9afc1875ec1fa
Full Text :
https://doi.org/10.1109/tns.2015.2496381
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