Back to Search Start Over

A 500MHz Random Cycle 1.5ns-Latency, SOI Embedded DRAM Macro Featuring a 3T Micro Sense Amplifier

Authors :
J. Griesemer
C. Tanner
William Robert Reohr
John W. Golz
J. Harig
Babar A. Khan
S. S. Iyer
Hyun-Chul Kim
T. Kirihata
Stanley E. Schuster
R.P. Havreluk
John E. Barth
Gregory J. Fredeman
Richard E. Matick
K. Yanagisawa
Paul C. Parries
Hillery C. Hunter
Source :
ISSCC
Publication Year :
2007
Publisher :
IEEE, 2007.

Abstract

A prototype SOI embedded DRAM macro is developed for high-performance microprocessors and introduces performance-enhancing 3T micro sense amplifier architecture (muSA). The macro was characterized via a test chip fabricated in a 65nm SOI deep-trench DRAM process. Measurements confirm 1.5ns random access time with a 1V supply at 85deg and low voltage operation with a 600mV supply.

Details

Database :
OpenAIRE
Journal :
2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers
Accession number :
edsair.doi...........f885479054fd673652676cdef5d88eff
Full Text :
https://doi.org/10.1109/isscc.2007.373506