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Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data

Authors :
Yong-Il Kim
Duncan H. Gregory
Duk Young Jeon
Won Bin Im
Seung Hoon Nahm
Source :
Journal of Luminescence. 115:1-6
Publication Year :
2005
Publisher :
Elsevier BV, 2005.

Abstract

Blue-color emitting material, CaMgSi 2 O 6 :Eu 2+ (CMS:Eu 2+ ), was synthesized by a normal solid state reaction using CaCO 3 , MgO, SiO 2 and EuF 3 as starting materials. The Rietveld method was employed to quantitatively determine the structural parameters of synthesized CMS:Eu 2+ . The structural parameters for CMS:Eu 2+ were successfully determined by Rietveld refinement using X-ray powder diffraction data. The final weighted R -factor, R wp , was 9.22% and the goodness-of-fit indicator, S ( = R wp / R e ) , was 1.45. The synthesized sample consisted of CMS:Eu 2+ and SiO 2 (cristobalite) phases with refined phase fractions of 89.18(1)% and 10.82(2)%, respectively. Doped Eu 2+ ions occupied the Ca sites (4 e ) and replaced 1.0% of the Ca 2+ ions. The refined model of CMS:Eu 2+ describes a structure in monoclinic space group C 2/ c with Z = 4 , a = 9.7474 (2) A, b = 8.9384 (2) A, c = 5.2490 (1) A and β = 105.87 (1)°.

Details

ISSN :
00222313
Volume :
115
Database :
OpenAIRE
Journal :
Journal of Luminescence
Accession number :
edsair.doi...........f60dee920b5a7775eb06c0eb4472c462