Back to Search Start Over

Beryllium-Based Multilayer Structures

Authors :
C. Alford
Regina Soufli
J. B. Kortright
James H. Underwood
Mark A. Wall
Kenneth M. Skulina
Eric M. Gullikson
Richard M. Bionta
Daniel G. Stearns
D. M. Makowiecki
Source :
MRS Proceedings. 382
Publication Year :
1995
Publisher :
Springer Science and Business Media LLC, 1995.

Abstract

Multilayer (ML) structures composed of Mo-Be, Ru-Be and Rh-Be with bilayer periods of - 6 nm have been grown using dc magnetron sputter deposition. The ML microstructure has been characterized using x-ray diffraction and high-resolution transmission electron microscopy, and the normal incidence reflectivity has been measured at soft x-ray wavelengths.

Details

ISSN :
19464274 and 02729172
Volume :
382
Database :
OpenAIRE
Journal :
MRS Proceedings
Accession number :
edsair.doi...........f591b5c58cf4518eee9432ae69a888b3