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Enablement of STT-MRAM as last level cache for the high performance computing domain at the 5nm node

Authors :
W. Kim
Arnaud Furnemont
D. Yakimets
Hr. Oh
Alessio Spessot
Siddharth Rao
G. Sankar Kar
T. Huynh Bao
F. Yasin
J. Swerts
Sushil Sakhare
Anda Mocuta
Shreya Kundu
M. Perumkunnil
D. Crotti
Rogier Baert
Sebastien Couet
Source :
2018 IEEE International Electron Devices Meeting (IEDM).
Publication Year :
2018
Publisher :
IEEE, 2018.

Abstract

The increased complexity of CMOS transistor processing has led to limited scaling of high density SRAM cell at advanced technology nodes. STT-MRAM appears to be a promising candidate for replacing last level caches (LLC). This paper addresses design technology co-optimization (DTCO) of STT-MRAM technology and analyzes its viability as a LLC (compared to SRAM) for the high performance computing (HPC) domain (while maintaining a constraint of occupying merely 43.3% of SRAM macro area at identical capacities). This is the first study that breaks down a power, performance and area (PPA) comparison between SRAM and STT-MRAM based LLCs at the 5nm node. The STT-MRAM design and analysis is based on a silicon verified compact model and can be realized using 193i single patterning at the 5nm node. Our STT-MRAM design manages to achieve a nominal access latency

Details

Database :
OpenAIRE
Journal :
2018 IEEE International Electron Devices Meeting (IEDM)
Accession number :
edsair.doi...........f521cf3be83341e68098e4a770912037
Full Text :
https://doi.org/10.1109/iedm.2018.8614637