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Enablement of STT-MRAM as last level cache for the high performance computing domain at the 5nm node
- Source :
- 2018 IEEE International Electron Devices Meeting (IEDM).
- Publication Year :
- 2018
- Publisher :
- IEEE, 2018.
-
Abstract
- The increased complexity of CMOS transistor processing has led to limited scaling of high density SRAM cell at advanced technology nodes. STT-MRAM appears to be a promising candidate for replacing last level caches (LLC). This paper addresses design technology co-optimization (DTCO) of STT-MRAM technology and analyzes its viability as a LLC (compared to SRAM) for the high performance computing (HPC) domain (while maintaining a constraint of occupying merely 43.3% of SRAM macro area at identical capacities). This is the first study that breaks down a power, performance and area (PPA) comparison between SRAM and STT-MRAM based LLCs at the 5nm node. The STT-MRAM design and analysis is based on a silicon verified compact model and can be realized using 193i single patterning at the 5nm node. Our STT-MRAM design manages to achieve a nominal access latency
- Subjects :
- 010302 applied physics
Magnetoresistive random-access memory
Hardware_MEMORYSTRUCTURES
Computer science
business.industry
Crossover
02 engineering and technology
021001 nanoscience & nanotechnology
Supercomputer
01 natural sciences
CMOS
Hardware_GENERAL
Embedded system
0103 physical sciences
Node (circuits)
Cache
Static random-access memory
0210 nano-technology
business
Design technology
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2018 IEEE International Electron Devices Meeting (IEDM)
- Accession number :
- edsair.doi...........f521cf3be83341e68098e4a770912037
- Full Text :
- https://doi.org/10.1109/iedm.2018.8614637