Permittivity Estimation of Dielectric Substrate Materials via Enhanced SIW Sensor

MLA

M. Jaleel Akhtar, and Prashant Kumar Varshney. “Permittivity Estimation of Dielectric Substrate Materials via Enhanced SIW Sensor.” IEEE Sensors Journal, vol. 21, May 2021, pp. 12104–12. EBSCOhost, https://doi.org/10.1109/jsen.2021.3064923.

APA

M. Jaleel Akhtar, & Prashant Kumar Varshney. (2021). Permittivity Estimation of Dielectric Substrate Materials via Enhanced SIW Sensor. IEEE Sensors Journal, 21, 12104–12112. https://doi.org/10.1109/jsen.2021.3064923

Chicago

M. Jaleel Akhtar, and Prashant Kumar Varshney. 2021. “Permittivity Estimation of Dielectric Substrate Materials via Enhanced SIW Sensor.” IEEE Sensors Journal 21 (May): 12104–12. doi:10.1109/jsen.2021.3064923.