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Authors :
Tadashi Shiosaki
Shinzo Ohnishi
Akira Kawabata
Masaru Shimizu
Source :
SHINKU. 24:49-59
Publication Year :
1981
Publisher :
The Vacuum Society of Japan, 1981.

Abstract

ZnO films with an excellent c-axis orientation, transparancy, and surface flatness have been prepared by high deposition-rate rf planar magnetron sputtering. The optical waveguide loss for the TE0 mode of He-Ne 6328 A line is as low as 2.0 dB/cm in a 4.2 μm thick film without postsputtering treatment. Single-crystalline ZnO films have been grown epitaxial onto sapphire substrates in a ZnO-H2-H2O-O2 system. In this growth, water vapor and intermediately-sputter-deposited very-thin ZnO epitaxial layer are very important to grow ZnO films with an optically flat surface. The optical waveguide loss for the TE0 mode (6328 A) is as low as 0.7 dB/cm in a 2.57 μm thick film without postgrowth treatment.

Details

ISSN :
18809413 and 05598516
Volume :
24
Database :
OpenAIRE
Journal :
SHINKU
Accession number :
edsair.doi...........f46324e6fe022be298a9ada121fe2f4f
Full Text :
https://doi.org/10.3131/jvsj.24.49