Cite
Reliability Qualification of CoSi2 Electrical Fuse for 90Nm Technology
MLA
Byeongju Park, et al. “Reliability Qualification of CoSi2 Electrical Fuse for 90Nm Technology.” 2006 IEEE International Reliability Physics Symposium Proceedings, Jan. 2006. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........f457e1ce6eb5ff0bb973206e51c96278&authtype=sso&custid=ns315887.
APA
Byeongju Park, Ss. Iyer, Chandrasekharan Kothandaraman, Norman Robson, John M. Safran, Deok-kee Kim, & C. E. Tian. (2006). Reliability Qualification of CoSi2 Electrical Fuse for 90Nm Technology. 2006 IEEE International Reliability Physics Symposium Proceedings.
Chicago
Byeongju Park, Ss. Iyer, Chandrasekharan Kothandaraman, Norman Robson, John M. Safran, Deok-kee Kim, and C. E. Tian. 2006. “Reliability Qualification of CoSi2 Electrical Fuse for 90Nm Technology.” 2006 IEEE International Reliability Physics Symposium Proceedings, January. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........f457e1ce6eb5ff0bb973206e51c96278&authtype=sso&custid=ns315887.