Transient electron heat diffusivity obtained from trace impurity injection on TFTR

A new method for obtaining a transient ('pulse') electron heat diffusivity (χep) in the radial region 0.38 < r/a < 0.56 in TFTR L mode discharges is presented. Small electron temperature perturbations were caused by single bursts of injected impurities which radiated and cooled the plasma edge. A case of iron injection by laser ablation was found to be more definitive than a supporting helium gas puff case. In this new 'cold pulse' method, the authors concentrate on modelling just the electron temperature perturbations, tracked with electron cyclotron emission diagnostics, and on being able to justify separation of the perturbations in space and time from the cooling source. This χep is obtained for these two cases to be χep = (6.0 m2/s ± 35%) ~ 4χe (power balance), which is consistent with but more definitive than results from other studies that are more susceptible to ambiguities in the source profile