IR reflection–absorption spectra of thin water ice films between 10 and 160 K at low pressure

Fourier Transform infrared reflexion spectroscopy (incidence angle of 5°) was used to characterize thin water ice films between 10 and 160 K under a pressure of 10−7 mbar. Spectral features of the OH stretching band related to structural differences are described and discussed in the light of this and previous works performed either by infrared transmission or by reflection absorption infrared spectroscopy (RAIRS) at large incidence. Comparison of our spectra with those obtained in the literature shows that assignment of the bands is still uncertain based on our current understanding of the physical nature of water in the solid phase.