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High-speed line-scan confocal Raman microscope with enhanced diffraction efficiency

Authors :
Hongki Yoo
Young-Man Choi
Jingchao Xing
Sung Hoon Kang
Seungwoo Lee
Source :
Measurement Science and Technology. 31:025203
Publication Year :
2019
Publisher :
IOP Publishing, 2019.

Subjects

Subjects :
Materials science
Optics
Spectrometer
business.industry
Applied Mathematics
Confocal
Raman microscope
Diffraction efficiency
Line scan
business
Instrumentation
Engineering (miscellaneous)

Details

ISSN :
13616501 and 09570233
Volume :
31
Database :
OpenAIRE
Journal :
Measurement Science and Technology
Accession number :
edsair.doi...........f37477f1cab8ff43cc28501ae0d1e2ff

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