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MASTAR - A Model For Analog Simulation Of Subthreshold, Saturation And Weak Avalanche Regions In MOSFETs

Authors :
C. Denat
Gerard Merckel
Tomasz Skotnicki
Source :
[Proceedings] 1993 International Workshop on VLSI Process and Device Modeling (1993 VPAD).
Publication Year :
2005
Publisher :
IEEE, 2005.

Subjects

Subjects :
Engineering
business.industry
Subthreshold conduction
Electrical engineering
Optoelectronics
Solid modeling
Mosfet circuits
business
Saturation (magnetic)
Subthreshold slope
Threshold voltage

Details

Database :
OpenAIRE
Journal :
[Proceedings] 1993 International Workshop on VLSI Process and Device Modeling (1993 VPAD)
Accession number :
edsair.doi...........f16fde2df5cbddb2aa090d8cc43e41c2
Full Text :
https://doi.org/10.1109/vpad.1993.724762
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