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Radiation Defects and Carrier Lifetime in Tin-Doped n-Type Silicon

Authors :
Eddy Simoen
A Kraitchinskii
V. B. Neimash
Cor Claeys
L.I. Shpinar
M. Kras'ko
Source :
Solid State Phenomena. :425-430
Publication Year :
2001
Publisher :
Trans Tech Publications, Ltd., 2001.

Details

ISSN :
16629779
Database :
OpenAIRE
Journal :
Solid State Phenomena
Accession number :
edsair.doi...........f0bd2412fc1bd17f989e19a7abd61240
Full Text :
https://doi.org/10.4028/www.scientific.net/ssp.82-84.425