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Radiation Defects and Carrier Lifetime in Tin-Doped n-Type Silicon
- Source :
- Solid State Phenomena. :425-430
- Publication Year :
- 2001
- Publisher :
- Trans Tech Publications, Ltd., 2001.
Details
- ISSN :
- 16629779
- Database :
- OpenAIRE
- Journal :
- Solid State Phenomena
- Accession number :
- edsair.doi...........f0bd2412fc1bd17f989e19a7abd61240
- Full Text :
- https://doi.org/10.4028/www.scientific.net/ssp.82-84.425