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Developing XCT data sets for evaluation of automated flaw detection algorithms (Conference Presentation)

Authors :
Felix H. Kim
Owen V. Hammer
Adam L. Pintar
John Henry J. Scott
Edward J. Garboczi
Source :
8th International Workshop on Reliability of NDT/NDE.
Publication Year :
2023
Publisher :
SPIE, 2023.

Details

Database :
OpenAIRE
Journal :
8th International Workshop on Reliability of NDT/NDE
Accession number :
edsair.doi...........f07b89c68c56e1ca8868724893114dec
Full Text :
https://doi.org/10.1117/12.2657270