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Developing XCT data sets for evaluation of automated flaw detection algorithms (Conference Presentation)
- Source :
- 8th International Workshop on Reliability of NDT/NDE.
- Publication Year :
- 2023
- Publisher :
- SPIE, 2023.
Details
- Database :
- OpenAIRE
- Journal :
- 8th International Workshop on Reliability of NDT/NDE
- Accession number :
- edsair.doi...........f07b89c68c56e1ca8868724893114dec
- Full Text :
- https://doi.org/10.1117/12.2657270