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A Design of 16-bit High Speed DAC with Segmented R2R Load

Authors :
Weidong Yang
Dongbing Fu
Jun Liu
Xianjie Wan
Dan Ma
Source :
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT).
Publication Year :
2020
Publisher :
IEEE, 2020.

Abstract

This paper describes a 16-bit 5GSPS high-speed DAC with segmented R2R load, using a 65nm CMOS process, and consists of a SERDES receiver, a high-speed thermometer decoder, a high-speed MUX, a high-speed data latch, a DAC core, and so on. Through the R2R load to ensure that the current density of each pair of switch is the same. The same drive unit is used for the switch input stage, which ensures that the switch changes at the same time. Switching simultaneously can improve the dynamic performance of the high speed DAC. In this paper measured performance of greater than 65 dBc SFDR is achieved at 500 MHz output signal.

Details

Database :
OpenAIRE
Journal :
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
Accession number :
edsair.doi...........ef64b1fce9f910985f301564dcbe4d71