Impurity Segregation via Extended Defects in Oxide Thin Films Probed by Aberration-Corrected STEM-EELS

Authors :: David J. Baek
Harold Y. Hwang
Di Lu
Lena F. Kourkoutis
Yasuyuki Hikita
Source :: Microscopy and Microanalysis. 22:1518-1519
Publication Year :: 2016
Publisher :: Oxford University Press (OUP), 2016.

Subjects :: chemistry.chemical_compound
Materials science
chemistry
business.industry
Impurity
Stem eels
Oxide
Optoelectronics
Thin film
business
Instrumentation

Tools