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The Identification of TP Chromatic Aberration by Using Nearly Equivalent NN Model

Authors :
Rey Chue Hwang
Du Jou Huang
Chih Chien Huang
Shu Ming T. Wang
Yu-Ju Chen
Source :
Advanced Materials Research. :275-279
Publication Year :
2011
Publisher :
Trans Tech Publications, Ltd., 2011.

Abstract

This paper presents the chromatic aberration identification of touch panel (TP) decoration film by using nearly equivalent neural network (NN) model. This model is expected to adequately catch the complex relationship between the chromatic aberration and its possible influencing factors during the evaporation process of TP decoration film. Then, an intelligent estimator for the chromatic aberration of TP film could be developed automatically. Based on this estimator, the technician could set the control parameters of evaporation process in advance and make the quality of chromatic aberration of TP could meet the customer’s required.

Details

ISSN :
16628985
Database :
OpenAIRE
Journal :
Advanced Materials Research
Accession number :
edsair.doi...........ee6aaa05861caf23500978d8030d99e9