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Efficient Learning for Test Feature Classifier by Overlap Index List

Authors :
Hidenori Takauji
Shun'ichi Kaneko
Yoshikazu Matsuo
Source :
IEEJ Transactions on Electronics, Information and Systems. 133:211-218
Publication Year :
2013
Publisher :
Institute of Electrical Engineers of Japan (IEE Japan), 2013.

Abstract

SUMMARY This paper presents a novel low cost learning algorithm for a test feature classifier by use of an overlap index list (OIL). In general, classifiers need a large amount of training data to achieve the high performance, which results in long computation times. The proposed algorithm using OIL can maintain search and check elemental combinatorial features from lower dimensions up to higher ones. Classification problems in real industrial inspection lines have been solved by the proposed algorithm, and large reductions in computation time have been obtained.

Details

ISSN :
13488155 and 03854221
Volume :
133
Database :
OpenAIRE
Journal :
IEEJ Transactions on Electronics, Information and Systems
Accession number :
edsair.doi...........ee012c721ab6e5d9a47596e3f09182e9
Full Text :
https://doi.org/10.1541/ieejeiss.133.211