SIMS Depth Profiling of Organic Materials with Ar Cluster Ion Beam

MLA

Jiro Matsuo, et al. “SIMS Depth Profiling of Organic Materials with Ar Cluster Ion Beam.” Transactions of the Materials Research Society of Japan, vol. 35, Jan. 2010, pp. 785–88. EBSCOhost, https://doi.org/10.14723/tmrsj.35.785.

APA

Jiro Matsuo, Satoshi Ninomiya, Takaaki Aoki, Kazuya Ichiki, Toshio Seki, Yoshihiko Nakata, & Hideaki Yamada. (2010). SIMS Depth Profiling of Organic Materials with Ar Cluster Ion Beam. Transactions of the Materials Research Society of Japan, 35, 785–788. https://doi.org/10.14723/tmrsj.35.785

Chicago

Jiro Matsuo, Satoshi Ninomiya, Takaaki Aoki, Kazuya Ichiki, Toshio Seki, Yoshihiko Nakata, and Hideaki Yamada. 2010. “SIMS Depth Profiling of Organic Materials with Ar Cluster Ion Beam.” Transactions of the Materials Research Society of Japan 35 (January): 785–88. doi:10.14723/tmrsj.35.785.