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Study on predicting the temperature of stacked chip based on thermal resistance matrix
- Source :
- 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
- Publication Year :
- 2017
- Publisher :
- IEEE, 2017.
-
Abstract
- In this study, a four-layer stacked chip simulation model is built under standard JEDEC environment, the heat dissipation path and temperature distribution of the stacked chip is analyzed. Based on linear superposition method, a method of estimating the temperature of stacked chip using thermal resistance matrix is proposed, and the function relationship between the power consumption and the element values of the thermal resistance matrix is established. The accuracy of the thermal resistance matrix is researched through simulation analysis, and the difference between the results of the thermal resistance matrix prediction and the simulation results is about 0.01%.
- Subjects :
- Materials science
Thermal resistance
020208 electrical & electronic engineering
Hardware_PERFORMANCEANDRELIABILITY
02 engineering and technology
Thermal management of electronic devices and systems
Function (mathematics)
Chip
Superposition principle
Matrix (mathematics)
Power consumption
Hardware_INTEGRATEDCIRCUITS
0202 electrical engineering, electronic engineering, information engineering
Electronic engineering
Composite material
Thermal analysis
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
- Accession number :
- edsair.doi...........ec5e10f22cd5ead1499c5bb20c821c62