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Modelling of inductively coupled plasma processing reactors
- Source :
- Journal of Physics D: Applied Physics. 34:2742-2747
- Publication Year :
- 2001
- Publisher :
- IOP Publishing, 2001.
-
Abstract
- A comprehensive model has been developed to study low-pressure, high-density plasma processing reactors. The model couples plasma generation and transport self-consistently to fluid flow and gas energy equations. The model and the simulation software have been used to analyse chlorine plasmas used in metal etching. The effect of the inductive coil frequency on the plasma characteristics has been examined and found to influence plasma uniformity only moderately. Model predictions for a CF4 plasma have been found to agree well with experimental results.
- Subjects :
- Plasma etching
Acoustics and Ultrasonics
Chemistry
Plasma
Mechanics
Condensed Matter Physics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Physics::Plasma Physics
Electromagnetic coil
Etching (microfabrication)
Physics::Space Physics
Fluid dynamics
Electron temperature
Atomic physics
Inductively coupled plasma
Plasma processing
Subjects
Details
- ISSN :
- 13616463 and 00223727
- Volume :
- 34
- Database :
- OpenAIRE
- Journal :
- Journal of Physics D: Applied Physics
- Accession number :
- edsair.doi...........eb98da7a40c1465de9d334989dc675f0
- Full Text :
- https://doi.org/10.1088/0022-3727/34/18/305