Investigation of hygrothermally induced failures in multilayer ceramic capacitors during thermal reflow process

Authors :: Rilwan Kayode Apalowo
Aizat Abas
Zuraihana Bachok
Mohamad Fikri Mohd Sharif
Fakhrozi Che Ani
Mohamad Riduwan Ramli
Muhamed Abdul Fatah bin Muhamed Mukhtar
Source :: Microelectronics Reliability. 146:115028
Publication Year :: 2023
Publisher :: Elsevier BV, 2023.

Subjects :: Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials

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