A high resolution Poly-Si TFT–LCD employing analog sample and hold driver

In this study, we have developed high performance TFT (thin film transistor) and a 7.4-inch high resolution LCD (liquid crystal display) panel of full color WSXGA (1600 × RGB × 1024, 257 ppi, 43% aperture ratio) format using ‘sequential lateral solidification (SLS)’ laser crystallization process [Y.J. Kim et al., Grain boundary effect on the characteristics of the high-performance poly-Si TFTs crystallized by SLS Technique, AM-LCD (2005) 249–251]. The gate and data driver circuits were integrated on panel and the integrated drivers comprise a sequential analog sampling data driver and a dual logic gate scanner for redundancy. In addition, we have improved key process for fine image quality. Metal lines used Cu/MoX (5000 A/300 A) for uniform data transfer and array on BM (black matrix) structure for lager aperture ratio was adopted.