Back to Search
Start Over
Simultaneous atomic force microscopy measurement of topography and contact resistance of metal films and carbon nanotubes
- Source :
- Review of Scientific Instruments. 74:3653-3655
- Publication Year :
- 2003
- Publisher :
- AIP Publishing, 2003.
-
Abstract
- We present a quartz tuning-fork-based atomic force microscopy (AFM) setup that is capable of mapping the surface contact resistance while scanning topography. The tuning-fork setup allows us to use etched Pt/Ir tips, which have higher durability and better conductivity than probes used in earlier AFM conductance measurements. The performance of the method is demonstrated with contact resistance measurements of gold lines on silicon dioxide and carbon nanotubes on graphite.
- Subjects :
- Kelvin probe force microscope
Materials science
Contact resistance
Atomic force acoustic microscopy
Mechanical properties of carbon nanotubes
Nanotechnology
Carbon nanotube
Conductive atomic force microscopy
law.invention
law
Composite material
Instrumentation
Sheet resistance
Photoconductive atomic force microscopy
Subjects
Details
- ISSN :
- 10897623 and 00346748
- Volume :
- 74
- Database :
- OpenAIRE
- Journal :
- Review of Scientific Instruments
- Accession number :
- edsair.doi...........e91030a1519eeaf6dd652ff2e6415878