Probability of Tight Crack Detection via Eddy-Current Inspection

Among current NDE investigations, one of the important topics is the development of so-called probability-of-detection (POD) models. This activity is important because, given a POD model, one can examine inspection systems quantitatively in terms of flaw detectability. In the area of the eddy-current (EC) testing, there are a few applicable POD models in the literature [1,2]. In this paper, we will report on a generalization of the model constructed by one of the present authors [2]. After the generalization is done, the model becomes applicable to a wider variety of flaws than before.